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Child Jointed Test Finger (18 Test Probe)
Child Jointed Test Finger (18 Test Probe)
Child Jointed Test Finger (18 Test Probe)
Child Jointed Test Finger (18 Test Probe)

Child Jointed Test Finger (18 Test Probe)

Child Jointed Test Finger (18 Test Probe)

Child Jointed Test Finger (18 Test Probe) is supplied by Shenzhen Lansco Testing Instrument Co., Ltd. for Test Probes, Pins and Test Vessels. It supports laboratory testing, product development, certification testing and production quality control. Custom test solutions are available according to standards, samples and working conditions.

Product Overview

Child Jointed Test Finger (18 Test Probe)

Child Jointed Test Finger (18 Test Probe) is a testing instrument supplied by Shenzhen Lansco Testing Instrument Co., Ltd. It is suitable for Test Probes, Pins and Test Vessels, laboratory testing, product development, certification testing and production quality control. Custom test solutions can be provided according to relevant standards and working conditions.

Child Jointed Test Finger (18 Test Probe)

Applicable Standards

GB4706.21-2008, IEC61032-1997, IEC61032

Application

Child Jointed Test Finger (18 Test Probe) is used for laboratory testing, product development, certification testing and production quality control. It helps manufacturers and laboratories evaluate product safety, performance, durability and compliance under controlled test conditions.

Technical Features and Parameters

  • : LSK-113 Test(18Test)1, GB4706.21-2008, IEC61032-1997 UL
  • 2, Test(18Test)Test

Custom Service

Shenzhen Lansco Testing Instrument Co., Ltd. can provide customized test equipment solutions according to applicable standards, sample size, test conditions, chamber dimensions, control method and automation requirements.

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